Local current measurements of an insulating layer using an UHV atomic force microscope in contact mode

Local current measurements of an insulating layer using an UHV atomic force microscope in contact mode, Gilles, B., Fettar, F., Pillet, J.-C., Marty, A., Ernult, F., Monso, S., Dieny, B., Journal of Magnetism and Magnetic Materials, 242-245, 1261 (2002)


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