Spin-polarized electronic reflections at metal-oxide interfaces: A technique for characterizing tunneling barriers in magnetic random access memory devices

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Spintec > CONFERENCE PROCEEDINGS > Spin-polarized electronic reflections at metal-oxide interfaces: A technique for characterizing tunneling barriers in magnetic random access memory devices

CONFERENCE PROCEEDINGS

Spin-polarized electronic reflections at metal-oxide interfaces: A technique for characterizing tunneling barriers in magnetic random access memory devices, Ounadjela, K., da Costa, V., Iovan, A., Dimopoulos, T., Dahmani, F., Mahenthiran, D., Dieny, B., Allen, W., Gregg, J.F., Journal of Applied Physics, 91, 7466 (2002)