Spin-polarized electronic reflections at metal-oxide interfaces: A technique for characterizing tunneling barriers in magnetic random access memory devices

Spin-polarized electronic reflections at metal-oxide interfaces: A technique for characterizing tunneling barriers in magnetic random access memory devices, Ounadjela, K., da Costa, V., Iovan, A., Dimopoulos, T., Dahmani, F., Mahenthiran, D., Dieny, B., Allen, W., Gregg, J.F., Journal of Applied Physics, 91, 7466 (2002)


Copyright © 2015 - Spintec.fr - Réalisation par OXIWIZ

Scroll to Top