Exchange bias in antiferromagnetic-ferromagnetic-antiferromagnetic structures with out-of-plane magnetization, Sort, J., Dieny, B., Noguès, J., Physical Review B, 72, 104412 (2005)

Exploiting length scales of exchange bias systems to fully tailor double-shifted hysteresis loops, Brück, S., Sort, J., Baltz, V., Surinach, S., Munoz, J.S., Dieny, B., Baró, M.D., Noguès, J., 17, 2978 (2005)

Tailoring perpendicular exchange bias in [Pt/Co]-IrMn multilayers, Sort, J., Baltz, V., Garcia, F., Rodmacq, B., Dieny, B., Physical Review B, 71, 054411 (2005)

Thermal activation effects on the exchange bias in ferromagnetic-antiferromagnetic nanostructures, Baltz, V., Sort, J., Rodmacq, B., Dieny, B., Landis, S., Physical Review B, 72, 104419 (2005)

Magnetic relaxation of exchange-biased Pt/Co multilayers studied by time-resolved Kerr microscopy, Romanens, F., Pizzini, S., Yokaichiya, F., Bonfim, M., Pennec, Y., Camarero, J., Vogel, J., Sort, J., Garcia, F., Rodmacq, B., Dieny, B., Physical Review B, 72, 134410 (2005)

Tailoring size effects on the exchange bias of sub-100nm ferromagnetic-antiferromagnetic nanostructures, Baltz, V., Sort, J., Landis, S., Rodmacq, B., Dieny, B., Physical Review Letters, 94, 117201 (2005)

Magnetic relaxation measurements of exchange-biased (Pt/Co) multilayers with perpendicular anisotropy, Romanens, F., Pizzini, S., Sort, J., Garcia, F., Camarero, J., Yokaichiya, F., Pennec, Y., Vogel, J., Dieny, B., European Physical Journal B, 45, 185 (2005)

EPR investigation of manganese ions in 70TeO, Ardelean, I., Peteanu, M., Muresan, N., Ioncu, V., Ciorcas-Delille, F., 7, 2661 (2005)

Exchange bias in ferromagnetic nanoparticies embedded in an antiferromagnetic matrix, Noguès, J., Sort, J., Langlais, V., Doppiu, S., Dieny, B., Munoz, J.S., Surinach, S., Baró, M.D., Stoyanov, S., Zhang, Y., International Journal of Nanotechnology, 2, 23 (2005)

Magnetization dynamics and thermal stability in patterned media, Moritz, J., Dieny, B., Nozières, J.-P., van de Veerdonk, R.J.M., Crawford, T.M., Weller, D., Landis, S., Applied Physics Letters, 86, 063512 (2005)