Domain structure in magnetic dots prepared by nanoimprint and e-beam lithography, Moritz, J., Dieny, B., Nozières, J.-P., Landis, S., Lebib, A., Chen, Y., Journal of Applied Physics, 91, 7314 (2002)

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Local current measurements of an insulating layer using an UHV atomic force microscope in contact mode, Gilles, B., Fettar, F., Pillet, J.-C., Marty, A., Ernult, F., Monso, S., Dieny, B., Journal of Magnetism and Magnetic Materials, 242-245, 1261 (2002)

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